TY  - RPRT
TI  - Development of test structures for characterization of the fabrication and performance of radiation-hardened charge-coupled device (CCD) imagers : annual report, December 1, 1978 to November 30, 1979
AU  - Carver, G P
AU  - Rubin, S
PY  - 1980
PB  - National Bureau of Standards
CY  - Gaithersburg, MD
SN  - NBS IR 80-2000
DO  - 10.6028/NBS.IR.80-2000
ER  -