TY  - RPRT
TI  - Measurement techniques for high power semiconductor materials and devices : annual report, October 1, 1977 to September 30, 1978
AU  - Oettinger, F F
PY  - 1979
PB  - National Bureau of Standards
CY  - Gaithersburg, MD
SN  - NBS IR 79-1756
DO  - 10.6028/NBS.IR.79-1756
ER  -