TY  - RPRT
TI  - Measurement techniques for high power semiconductor materials and devices : Annual report, January 1, to December 31, 1977
AU  - Oettinger, F F
PY  - 1978
PB  - National Bureau of Standards
CY  - Gaithersburg, MD
SN  - NBS IR 78-1474
DO  - 10.6028/NBS.IR.78-1474
ER  -