TY  - RPRT
TI  - Measurement techniques for high power semiconductor materials and devices : annual report, January 1 to December 31, 1976
AU  - Blackburn, D L
AU  - Koyama, R Y
AU  - Oattinger, F F
AU  - Rogers, G J
PY  - 1977
PB  - National Bureau of Standards
CY  - Gaithersburg, MD
SN  - NBS IR 77-1249
DO  - 10.6028/NBS.IR.77-1249
ER  -