TY  - RPRT
TI  - The application of test structures and test patterns to the development of radiation hardened integrated circuits : a review
AU  - Galloway, K F
AU  - Buehler, M G
PY  - 1976
PB  - National Bureau of Standards
CY  - Gaithersburg, MD
SN  - NBS IR 76-1093
DO  - 10.6028/NBS.IR.76-1093
ER  -