TY  - RPRT
TI  - The structure of slow crack interfaces in silicon nitride 
AU  - Tighe, N J
PY  - 1976
PB  - National Bureau of Standards
CY  - Gaithersburg, MD
SN  - NBS IR 76-1075
DO  - 10.6028/NBS.IR.76-1075
ER  -